X-ray diffraction with micrometer spatial resolution for highly absorbing samples

Chakrabarti, P.; Garrevoet, J.; Brandt, R.; Falch, K. V.; Falkenberg, Gerald; Galbierz, V.; Fevola, G.; Wildeis, A.; Hartmann, M.; Döhrmann, R.; Modregger, P.; Stuckelberger, M. E.; Ossig, C.

Preprint

PUBDB-2022-01322

X-ray diffraction with micrometer spatial resolution for highly absorbing samples

Chakrabarti, P. (Corresponding author)Extern* ; Wildeis, A.Extern* ; Hartmann, M. ; Brandt, R. ; Döhrmann, R.DESY* ; Fevola, G.Extern*DESY* ; Ossig, C.DESY* ; Stuckelberger, M. E.XFEL.EU*DESY* ; Garrevoet, J.DESY* ; Falch, K. V.DESY* ; Galbierz, V.DESY* ; Falkenberg, G.DESY* ; Modregger, P.Extern*

2022

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Report No.: arXiv:2201.13264

Abstract: X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilisation of low photon energies. Here, we report on a goniometer-based setup implemented at the P06 beamline of PETRA III that allows for micrometer spatial resolution with a photon energy of 35 keV and above. A highly focused beam was achieved by using compound refractive lenses and high precision sample manipulation was enabled by a goniometer that allows for up to 5D scans (3 rotations & 2 translations). As experimental examples, we demonstrate the determination of local strain variations in martensitic steel samples with micrometer spatial resolution as well as the simultaneous elemental distribution for high-Z materials in a thin film solar cell. Our proposed approach allows users from the materials science community to determine micro-structural properties even in highly absorbing samples.

Keyword(s): Materials Science (cond-mat.mtrl-sci) ; Applied Physics (physics.app-ph) ; FOS: Physical sciences

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