USiegen

⇧ externe Institute im Bereich Photon Science ⇧

Recent Publications

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http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Preprint Modregger, P. (Corresponding author)Extern* ; Wittwer, F.XFEL.EU*DESY* ; Khaliq, A.Extern* ; Pyrlik, N.Extern*DESY* ; Ball, J. A. D.Extern* ; Garrevoet, J.DESY* ; Falkenberg, G.DESY* ; Liehr, A.Extern* ; Stuckelberger, M.XFEL.EU*DESY*
Ultimate Sensitivity in X-ray Diffraction: Angular Moments vs. Shot Noise
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http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Astolfo, A. ; Haig, I. G. ; Bate, D. ; Olivo, A. (Corresponding author)Extern* ; Modregger, P.Extern*DESY*
Increased material differentiation through multi-contrast x-ray imaging: a preliminary evaluation of potential applications to the detection of threat materials
Physica scripta 98(9), 095501 (2023) [10.1088/1402-4896/ace939]2023     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Preprint Chakrabarti, P. (Corresponding author)Extern* ; Wildeis, A.Extern* ; Hartmann, M. ; Brandt, R. ; Döhrmann, R.DESY* ; Fevola, G.Extern*DESY* ; Ossig, C.DESY* ; Stuckelberger, M. E.XFEL.EU*DESY* ; Garrevoet, J.DESY* ; Falch, K. V.DESY* ; Galbierz, V.DESY* ; Falkenberg, G.DESY* ; Modregger, P.Extern*
X-ray diffraction with micrometer spatial resolution for highly absorbing samples
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All known publications ...
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