TY  - JOUR
AU  - Modregger, Peter
AU  - Wittwer, Felix
AU  - Khaliq, Ahmar
AU  - Pyrlik, Niklas
AU  - Ball, James A. D.
AU  - Garrevoet, Jan
AU  - Falkenberg, Gerald
AU  - Liehr, Alexander
AU  - Stuckelberger, Michael
TI  - Ultimate sensitivity in X-ray diffraction: angular moments versus shot noise
JO  - Journal of applied crystallography
VL  - 58
IS  - 5
SN  - 0021-8898
CY  - Copenhagen
PB  - Munksgaard
M1  - PUBDB-2025-03898
M1  - arXiv:2502.17977
SP  - NNN
PY  - 2025
N1  - Es fehlt die Genehmigung!!!
AB  - The sensitivity of x-ray diffraction experiments towards Bragg peak parameters constitutes a crucial performance attribute of experimental setups. Frequently, diffraction peaks are characterized by model-free angular moment analysis, which offers a greater versatility compared to traditional model-based peak fitting. Here, we have determined the ultimate sensitivity of angular moments for diffraction data that is limited by photon shot noise. We report experimentally achieved sensitivities of the first moment below 1/1000th of a detector pixel and below 1μrad. We have demonstrated the validity of our theoretical predictions by an excellent agreement with experimental results from three different setups. The provided formulas for the uncertainties of angular moments allow for the rapid determination of experimentally achieved sensitivities from single diffraction frames.
LB  - PUB:(DE-HGF)16
DO  - DOI:10.1107/S1600576725006715
UR  - https://bib-pubdb1.desy.de/record/637725
ER  -