TY  - EJOUR
AU  - Modregger, Peter
AU  - Wittwer, Felix
AU  - Khaliq, Ahmar
AU  - Pyrlik, Niklas
AU  - Ball, James A. D.
AU  - Garrevoet, Jan
AU  - Falkenberg, Gerald
AU  - Liehr, Alexander
AU  - Stuckelberger, Michael
TI  - Ultimate Sensitivity in X-ray Diffraction: Angular Moments vs. Shot Noise
IS  - arXiv:2502.17977
M1  - PUBDB-2025-00863
M1  - arXiv:2502.17977
PY  - 2025
AB  - The sensitivity of x-ray diffraction experiments towards Bragg peak parameters constitutes a crucial performance attribute of experimental setups. Frequently, diffraction peaks are characterized by model-free angular moment analysis, which offers a greater versatility compared to traditional model-based peak fitting. Here, we have determined the ultimate sensitivity of angular moments for diffraction data that is limited by photon shot noise. We report experimentally achieved sensitivities of the first moment below 1/1000th of a detector pixel and below 1μrad. We have demonstrated the validity of our theoretical predictions by an excellent agreement with experimental results from three different setups. The provided formulas for the uncertainties of angular moments allow for the rapid determination of experimentally achieved sensitivities from single diffraction frames.
LB  - PUB:(DE-HGF)25
UR  - https://bib-pubdb1.desy.de/record/624394
ER  -