Home > Publications database > Depth distribution of secondary phases in kesterite $Cu_{2}ZnSnS_{4}$ by angle-resolved X-ray absorption spectroscopy |
Journal Article | PUBDB-2021-03261 |
; ; ; ;
2017
AIP Publ.
Melville, NY
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Please use a persistent id in citations: doi:10.1063/1.5000306 doi:10.3204/PUBDB-2021-03261
Abstract: The depth distribution of secondary phases in the solar cell absorber material Cu$_2$ZnSnS$_4$ (CZTS) is quantitatively investigated using X-ray Absorption Near Edge Structure (XANES) analysis at the K-edge of sulfur at varying incidence angles. Varying information depths from several nanometers up to the full thickness is achieved. A quantitative profile of the phase distribution is obtained by a self-consistent fit of a multilayer model to the XANES spectra for different angles. Single step co-evaporated CZTS thin-films are found to exhibit zinc and copper sulfide secondary phases preferentially at the front or back interfaces of the film.The authors would like to gratefully acknowledge the provision of beamtime by HASYLAB and the Helmholtz-Zentrum Berlin (BESSY) as well as the support at the beamlines by Edmund Welter, Franz Schäfers, Mihaela Gorgoi, and Marcel Mertin. We gratefully acknowledge the provision of powder reference samples by Anna Ritscher of the Technische Universität Berlin. Furthermore, we would like to thank Tove Ericson and Jonathan Scragg from the University of Uppsala for the provision of a thin-film sample and inspiring discussions.
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