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@ARTICLE{Just:462087,
      author       = {Just, Justus and Luetzenkirchen-Hecht, Dirk and Müller, O.
                      and Frahm, Ronald and Unold, T.},
      title        = {{D}epth distribution of secondary phases in kesterite
                      ${C}u_{2}{Z}n{S}n{S}_{4}$ by angle-resolved {X}-ray
                      absorption spectroscopy},
      journal      = {APL materials},
      volume       = {5},
      number       = {12},
      issn         = {2166-532X},
      address      = {Melville, NY},
      publisher    = {AIP Publ.},
      reportid     = {PUBDB-2021-03261},
      pages        = {126106 (1-7)},
      year         = {2017},
      abstract     = {The depth distribution of secondary phases in the solar
                      cell absorber material Cu$_2$ZnSnS$_4$ (CZTS) is
                      quantitatively investigated using X-ray Absorption Near Edge
                      Structure (XANES) analysis at the K-edge of sulfur at
                      varying incidence angles. Varying information depths from
                      several nanometers up to the full thickness is achieved. A
                      quantitative profile of the phase distribution is obtained
                      by a self-consistent fit of a multilayer model to the XANES
                      spectra for different angles. Single step co-evaporated CZTS
                      thin-films are found to exhibit zinc and copper sulfide
                      secondary phases preferentially at the front or back
                      interfaces of the film.The authors would like to gratefully
                      acknowledge the provision of beamtime by HASYLAB and the
                      Helmholtz-Zentrum Berlin (BESSY) as well as the support at
                      the beamlines by Edmund Welter, Franz Schäfers, Mihaela
                      Gorgoi, and Marcel Mertin. We gratefully acknowledge the
                      provision of powder reference samples by Anna Ritscher of
                      the Technische Universität Berlin. Furthermore, we would
                      like to thank Tove Ericson and Jonathan Scragg from the
                      University of Uppsala for the provision of a thin-film
                      sample and inspiring discussions.},
      cin          = {FS-PS},
      ddc          = {600},
      cid          = {I:(DE-H253)FS-PS-20131107},
      pnm          = {899 - ohne Topic (POF4-899)},
      pid          = {G:(DE-HGF)POF4-899},
      experiment   = {EXP:(DE-H253)D-A1-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000418335000006},
      doi          = {10.1063/1.5000306},
      url          = {https://bib-pubdb1.desy.de/record/462087},
}