Journal Article

PUBDB-2021-00368

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Geometric determination of direction of dislocations using synchrotron X-ray transmission topography

Tuomi, T. O. (Corresponding author) ; Lankinen, A.Extern* ; Anttila, O.

2020
Wiley-Blackwell [S.l.]

This record in other databases:        

Please use a persistent id in citations: doi:10.1107/S1600577520011248

Abstract: When performing transmission polychromatic beam topography, the extensions to the line segments of the diffraction images of a straight dislocation are shown to intersect at a single point on the X-ray film. The location of this point, together with the diffraction pattern recorded on the film by synchrotron radiation, gives the crystallographic direction [hkl] of the dislocation unambiguously. The results of two synchrotron topography experiments are presented. Very long dislocations found in the center of a large 450 mm-diameter Czochralski silicon crystal align with the growth direction [001]. In the other silicon sample, the dislocations are of mixed type and along the [011] direction.

Note: Waiting for fulltext

---

Contributing Institute(s):

1. DOOR-User (DOOR ; HAS-User)

Research Program(s):

1. 899 - ohne Topic (POF3-899) (POF3-899)
2. FS-Proposal: II-20060222 EC (II-20060222-EC) (II-20060222-EC)

Experiment(s):

1. DORIS Beamline F1 (DORIS III)

Appears in the scientific report 2020

---

Database coverage:
; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; DEAL Wiley ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; Nationallizenz ; PubMed Central ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

---