%0 Journal Article
%A Tuomi, T. O.
%A Lankinen, A.
%A Anttila, O.
%T Geometric determination of direction of dislocations using synchrotron X-ray transmission topography
%J Journal of synchrotron radiation
%V 27
%N 6
%@ 1600-5775
%C [S.l.]
%I Wiley-Blackwell
%M PUBDB-2021-00368
%P 1674 - 1680
%D 2020
%Z Waiting for fulltext
%X When performing transmission polychromatic beam topography, the extensions to the line segments of the diffraction images of a straight dislocation are shown to intersect at a single point on the X-ray film. The location of this point, together with the diffraction pattern recorded on the film by synchrotron radiation, gives the crystallographic direction [hkl] of the dislocation unambiguously. The results of two synchrotron topography experiments are presented. Very long dislocations found in the center of a large 450 mm-diameter Czochralski silicon crystal align with the growth direction [001]. In the other silicon sample, the dislocations are of mixed type and along the [011] direction.
%F PUB:(DE-HGF)16
%9 Journal Article
%$ pmid:33147193
%U <Go to ISI:>//WOS:000588645400024
%R 10.1107/S1600577520011248
%U https://bib-pubdb1.desy.de/record/454011