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100 1 _ |a Tuomi, T. O.
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245 _ _ |a Geometric determination of direction of dislocations using synchrotron X-ray transmission topography
260 _ _ |a [S.l.]
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520 _ _ |a When performing transmission polychromatic beam topography, the extensions to the line segments of the diffraction images of a straight dislocation are shown to intersect at a single point on the X-ray film. The location of this point, together with the diffraction pattern recorded on the film by synchrotron radiation, gives the crystallographic direction [hkl] of the dislocation unambiguously. The results of two synchrotron topography experiments are presented. Very long dislocations found in the center of a large 450 mm-diameter Czochralski silicon crystal align with the growth direction [001]. In the other silicon sample, the dislocations are of mixed type and along the [011] direction.
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700 1 _ |a Lankinen, A.
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700 1 _ |a Anttila, O.
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773 _ _ |a 10.1107/S1600577520011248
|g Vol. 27, no. 6, p. 1674 - 1680
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|t Journal of synchrotron radiation
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