TY  - JOUR
AU  - Tuomi, T. O.
AU  - Lankinen, A.
AU  - Anttila, O.
TI  - Geometric determination of direction of dislocations using synchrotron X-ray transmission topography
JO  - Journal of synchrotron radiation
VL  - 27
IS  - 6
SN  - 1600-5775
CY  - [S.l.]
PB  - Wiley-Blackwell
M1  - PUBDB-2021-00368
SP  - 1674 - 1680
PY  - 2020
N1  - Waiting for fulltext
AB  - When performing transmission polychromatic beam topography, the extensions to the line segments of the diffraction images of a straight dislocation are shown to intersect at a single point on the X-ray film. The location of this point, together with the diffraction pattern recorded on the film by synchrotron radiation, gives the crystallographic direction [hkl] of the dislocation unambiguously. The results of two synchrotron topography experiments are presented. Very long dislocations found in the center of a large 450 mm-diameter Czochralski silicon crystal align with the growth direction [001]. In the other silicon sample, the dislocations are of mixed type and along the [011] direction.
LB  - PUB:(DE-HGF)16
C6  - pmid:33147193
UR  - <Go to ISI:>//WOS:000588645400024
DO  - DOI:10.1107/S1600577520011248
UR  - https://bib-pubdb1.desy.de/record/454011
ER  -