Journal Article PUBDB-2015-02246

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The thickness of native oxides on aluminum alloys and single crystals

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2015
Elsevier Amsterdam

Applied surface science 349, 826 - 832 () [10.1016/j.apsusc.2015.05.043]
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Abstract: We present results from measurements of the native oxide film thickness on four different industrial aluminum alloys and three different aluminum single crystals. The thicknesses were determined using X-ray reflectivity, X-ray photoelectron spectroscopy, and electrochemical impedance spectroscopy. In addition, atomic force microscopy was used for micro-structural studies of the oxide surfaces. The reflectivity measurements were performed in ultra-high vacuum, vacuum, ambient, nitrogen and liquid water conditions. The results obtained using X-ray reflectivity and X-ray photoelectron spectroscopy demonstrate good agreement. However, the oxide thicknesses determined from the electrochemical impedance spectroscopy show a larger discrepancy from the above two methods. In the present contribution the reasons for this discrepancy are discussed. We also address the effect of the substrate type and the presence of water on the resultant oxide thickness.

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Note: Elsevier B.V. Post referee full text in progress. Embargo for full text 1 year from 01.10.15.

Contributing Institute(s):
  1. DOOR-User (DOOR)
  2. Experimentebetreuung PETRA III (FS-PE)
Research Program(s):
  1. 6214 - Nanoscience and Materials for Information Technology (POF3-621) (POF3-621)
  2. 6G3 - PETRA III (POF3-622) (POF3-622)
  3. CALIPSO - Coordinated Access to Lightsources to Promote Standards and Optimization (312284) (312284)
Experiment(s):
  1. PETRA Beamline P08 (PETRA III)

Appears in the scientific report 2015
Database coverage:
Medline ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection
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 Record created 2015-06-11, last modified 2025-07-30


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