TY  - JOUR
AU  - Evertsson, J.
AU  - Bertram, F.
AU  - Zhang, F.
AU  - Rullik, L.
AU  - Merte, L. R.
AU  - Shipilin, Mikhail
AU  - Soldemo, M.
AU  - Ahmadi, S.
AU  - Vinogradov, N.
AU  - Carlà, F.
AU  - Weissenrieder, J.
AU  - Goethelid, Mats
AU  - Pan, J.
AU  - Mikkelsen, A.
AU  - Nilsson, J.-O.
AU  - Lundgren, E.
TI  - The thickness of native oxides on aluminum alloys and single crystals
JO  - Applied surface science
VL  - 349
SN  - 0169-4332
CY  - Amsterdam
PB  - Elsevier
M1  - PUBDB-2015-02246
SP  - 826 - 832
PY  - 2015
N1  - Elsevier B.V. Post referee full text in progress. Embargo for full text 1 year from 01.10.15.
AB  - We present results from measurements of the native oxide film thickness on four different industrial aluminum alloys and three different aluminum single crystals. The thicknesses were determined using X-ray reflectivity, X-ray photoelectron spectroscopy, and electrochemical impedance spectroscopy. In addition, atomic force microscopy was used for micro-structural studies of the oxide surfaces. The reflectivity measurements were performed in ultra-high vacuum, vacuum, ambient, nitrogen and liquid water conditions. The results obtained using X-ray reflectivity and X-ray photoelectron spectroscopy demonstrate good agreement. However, the oxide thicknesses determined from the electrochemical impedance spectroscopy show a larger discrepancy from the above two methods. In the present contribution the reasons for this discrepancy are discussed. We also address the effect of the substrate type and the presence of water on the resultant oxide thickness.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000357129100109
DO  - DOI:10.1016/j.apsusc.2015.05.043
UR  - https://bib-pubdb1.desy.de/record/220428
ER  -