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@ARTICLE{Evertsson:220428,
      author       = {Evertsson, J. and Bertram, F. and Zhang, F. and Rullik, L.
                      and Merte, L. R. and Shipilin, Mikhail and Soldemo, M. and
                      Ahmadi, S. and Vinogradov, N. and Carlà, F. and
                      Weissenrieder, J. and Goethelid, Mats and Pan, J. and
                      Mikkelsen, A. and Nilsson, J.-O. and Lundgren, E.},
      title        = {{T}he thickness of native oxides on aluminum alloys and
                      single crystals},
      journal      = {Applied surface science},
      volume       = {349},
      issn         = {0169-4332},
      address      = {Amsterdam},
      publisher    = {Elsevier},
      reportid     = {PUBDB-2015-02246},
      pages        = {826 - 832},
      year         = {2015},
      note         = {Elsevier B.V. Post referee full text in progress. Embargo
                      for full text 1 year from 01.10.15.},
      abstract     = {We present results from measurements of the native oxide
                      film thickness on four different industrial aluminum alloys
                      and three different aluminum single crystals. The
                      thicknesses were determined using X-ray reflectivity, X-ray
                      photoelectron spectroscopy, and electrochemical impedance
                      spectroscopy. In addition, atomic force microscopy was used
                      for micro-structural studies of the oxide surfaces. The
                      reflectivity measurements were performed in ultra-high
                      vacuum, vacuum, ambient, nitrogen and liquid water
                      conditions. The results obtained using X-ray reflectivity
                      and X-ray photoelectron spectroscopy demonstrate good
                      agreement. However, the oxide thicknesses determined from
                      the electrochemical impedance spectroscopy show a larger
                      discrepancy from the above two methods. In the present
                      contribution the reasons for this discrepancy are discussed.
                      We also address the effect of the substrate type and the
                      presence of water on the resultant oxide thickness.},
      cin          = {DOOR / FS-PE},
      ddc          = {670},
      cid          = {I:(DE-H253)HAS-User-20120731 / I:(DE-H253)FS-PE-20120731},
      pnm          = {6214 - Nanoscience and Materials for Information Technology
                      (POF3-621) / 6G3 - PETRA III (POF3-622) / CALIPSO -
                      Coordinated Access to Lightsources to Promote Standards and
                      Optimization (312284)},
      pid          = {G:(DE-HGF)POF3-6214 / G:(DE-HGF)POF3-6G3 /
                      G:(EU-Grant)312284},
      experiment   = {EXP:(DE-H253)P-P08-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000357129100109},
      doi          = {10.1016/j.apsusc.2015.05.043},
      url          = {https://bib-pubdb1.desy.de/record/220428},
}