Journal Article

PUBDB-2015-00174

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png X-ray reflectometry and related surface near X-ray scattering methods

Seeck, O. (Corresponding Author)DESY*

2014
De @Gruyter Berlin

This record in other databases:    

Please use a persistent id in citations: doi:10.1515/zpch-2014-0629

Abstract: Surface sensitive X-ray scattering methods are mostly non-destructive tools which are frequently used to investigate the nature of thin films, interfaces and artificial near surface structures. Discussed here are diffraction based methods, namely reflectometry and the related techniques grazing incidence diffraction and crystal truncation rod measurements. For the experiment, an X-ray beam is diffracted from surface near structures of the sample and detected by adequate detectors. To analyze the data the according X-ray scattering theory has to be applied. The full theory of surface sensitive X-ray scattering is complex and based on general considerations from wave optics. However, instructive insights into the scattering processes are provided by the Born-approximation which in many cases yields sufficient results. The methods are applied to solve the structure of a mercury-electrolyte interface during a chemical reaction and to determine the strain distribution in surface near SiGe quantum dots.

Note: (c) by Walter de Gruyter GmbH

---

Contributing Institute(s):

1. Experimentebetreuung PETRA III (FS-PE)

Research Program(s):

1. PETRA Beamline P08 (POF2-54G14) (POF2-54G14)

Experiment(s):

1. PETRA Beamline P08 (PETRA III)

Appears in the scientific report 2014

---

Database coverage:
; ; ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

---