TY  - JOUR
AU  - Seeck, Oliver
TI  - X-ray reflectometry and related surface near X-ray scattering methods
JO  - Zeitschrift für physikalische Chemie
VL  - 228
SN  - 0942-9352
CY  - Berlin
PB  - De @Gruyter
M1  - PUBDB-2015-00174
SP  - 1135 - 1154
PY  - 2014
N1  - (c) by Walter de Gruyter GmbH
AB  - Surface sensitive X-ray scattering methods are mostly non-destructive tools which are frequently used to investigate the nature of thin films, interfaces and artificial near surface structures. Discussed here are diffraction based methods, namely reflectometry and the related techniques grazing incidence diffraction and crystal truncation rod measurements. For the experiment, an X-ray beam is diffracted from surface near structures of the sample and detected by adequate detectors. To analyze the data the according X-ray scattering theory has to be applied. The full theory of surface sensitive X-ray scattering is complex and based on general considerations from wave optics. However, instructive insights into the scattering processes are provided by the Born-approximation which in many cases yields sufficient results. The methods are applied to solve the structure of a mercury-electrolyte interface during a chemical reaction and to determine the strain distribution in surface near SiGe quantum dots.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000347491400012
DO  - DOI:10.1515/zpch-2014-0629
UR  - https://bib-pubdb1.desy.de/record/205614
ER  -