DORIS Beamline D4

Grant period2005-2009
CategoriesBeamline
IdentifierG:(DE-H253)POF1-D4-20130405

Struktur der Materie    DORIS Beamline D4

 

Recent Publications

All known publications ...
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http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article  ;  ;  ;  ;  ;  ;  ;  ;  ; DESY
Combined Structural and Photoluminescence Study of SiGe Islands on Si Substrates: Comparison with Realistic Energy Level Calculations
New journal of physics 11(6), 063021 () [10.1088/1367-2630/11/6/063021]  GO OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Contribution to a book  ;  ;  ;  ;  ; DESY
Diffuse x-ray scattering from semiconductor nanostructures
Diffuse Scattering and the Fundamental Properties of Materials Diffuse Scattering and the Fundamental Properties of Materials 35-62 ()  GO BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Diploma Thesis  ; DESY
X-ray diffraction from III-V semiconductor nanowires
Johannes Kepler University Linz, Austria, Diplomarbeit, 2009  GO BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article  ;  ;  ;  ;  ;  ;  ;  ;  ;  ; DESY
3D SiGe quantum dot crsytals: structural characterization and electronic coupling
International journal of modern physics / B 23, 2836-2841 () [10.1142/S0217979209062414]  GO BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article  ;  ;  ;  ;  ; DESY
X-ray diffraction as a local probe tool
ChemPhysChem 10, 2923-2930 () [10.1002/cphc.200900563]  GO  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article  ;  ;  ;  ;  ;  ;  ; DESY
Interdiffusion in Ge rich SiGe/Ge multilayers studied by in situ diffraction
Physica status solidi / A 206, 1775-1779 () [10.1002/pssa.200881595]  GO  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Talk (non-conference)  ;  ;  ;  ;  ;  ;  ;  ; DESY
X-ray diffraction based characterization of nanowires
International Conference on One-dimensional Nanomaterials, ICON2009, AtlantaAtlanta, United States of America, 7 Dec 2009 - 9 Dec 20092009-12-072009-12-09  GO BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article  ; DESY
Vermessung einzelner Nanoinseln.
Physik in unserer Zeit 1, 46-51 () [10.1002/piuz.200801189]  GO  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Crystal Structure and Orientation of Nanowires
MRS Fall Meeting, Boston, MABoston, MA, United States of America, 30 Nov 2009 - 4 Dec 20092009-11-302009-12-04  GO BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ; DESY
Raman spectroscopy determination of composition and strain in $Si_{1-x}Ge_x$/Si heterostructures
Materials science in semiconductor processing 11, 279-284 () [10.1016/j.mssp.2008.09.012]  GO BibTeX | EndNote: XML, Text | RIS

All known publications ...
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 Record created 2013-04-05, last modified 2015-05-07



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