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@INPROCEEDINGS{Kriegner:88389,
      author       = {Kriegner, D. and Keplinger, M. and Stangl, J. and Andrews,
                      A. M. and Klang, P. and Detz, H. and Strasser, G. and Bauer,
                      G. and DESY},
      title        = {{X}-ray diffraction based characterization of nanowires},
      reportid     = {PHPPUBDB-15657},
      year         = {2009},
      month         = {Dec},
      date          = {2009-12-07},
      organization  = {International Conference on
                       One-dimensional Nanomaterials, Atlanta
                       (United States of America), 7 Dec 2009
                       - 9 Dec 2009},
      cin          = {HASYLAB},
      cid          = {$I:(DE-H253)HASYLAB_-2012_-20130307$},
      pnm          = {DORIS Beamline D4 (POF1-550) / DORIS Beamline BW2
                      (POF1-550)},
      pid          = {G:(DE-H253)POF1-D4-20130405 / G:(DE-H253)POF1-BW2-20130405},
      experiment   = {EXP:(DE-H253)D-BW2-20150101 / EXP:(DE-H253)D-D4-20150101},
      typ          = {PUB:(DE-HGF)31},
      url          = {https://bib-pubdb1.desy.de/record/88389},
}