%0 Journal Article
%A Pezzoli, F.
%A Bonera, E.
%A Grilli, E.
%A Guzzi, M.
%A Sanguinetti, S.
%A Chrastina, D.
%A Isella, G.
%A von Känel, H.
%A Wintersberger, E.
%A Stangl, J.
%A Bauer, G.
%A DESY
%T Raman spectroscopy determination of composition and strain in Si<sub>1−x</sub>Ge<sub>x</sub>/Si heterostructures
%J Materials science in semiconductor processing
%V 11
%@ 1369-8001
%C Amsterdam [u.a.]
%I Elsevier Science
%M PHPPUBDB-12804
%P 279-284
%D 2008
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000271700600026
%R 10.1016/j.mssp.2008.09.012
%U https://bib-pubdb1.desy.de/record/85955