Home > Publications database > Synchrotron topography and X-ray diffraction study of GaInP layers grown on GaAs/Ge |
Journal Article | PHPPUBDB-11981 |
; ; ; ; ; ; ;
2009
Elsevier
Amsterdam [u.a.]
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Please use a persistent id in citations: doi:10.1016/j.jcrysgro.2009.08.032
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