| Home > Publications database > Defect creation caused by the decay of cation excitons and hot electron-hole recombination in wide-gap dielectrics |
| Contribution to a conference proceedings/Journal Article | PHPPUBDB-484 |
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2006
Elsevier
Amsterdam [u.a.]
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Please use a persistent id in citations: doi:10.1016/j.nimb.2006.04.133
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