| Home > Publications database > High-flux CZT characterization using laser and X-ray induced Transient-Current Technique |
| Journal Article | PUBDB-2026-02297 |
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2026
Elsevier
[Amsterdam]
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Please use a persistent id in citations: doi:10.1016/j.nima.2026.172158 doi:10.3204/PUBDB-2026-02297
Abstract: High-flux CdZnTe sensors are promising candidates for detecting high energy photons at 4𝑡ℎ generation synchrotron and free-electron laser experiments. Especially in the unique case of the MHz pulse rates of European XFEL, it is imperative that the sensor collects the full deposited charge in 120 ns or less, and that there is negligible residual charge or dynamic changes in the detector properties at high fluxes. In that context, the Transient Current Technique (TCT) was used to study HF-CZT planar sensors, to characterize the charge transport properties of the sensors for various applied bias voltages. Two different electrode technologies were compared: one planar sensor had platinum contacts on both sides, while the other had platinum cathode and titanium-gold anode. The sensors were tested in a TCT station with a pulsed 660 nm laser and also taken to the P07-EH1 beamline at Petra III during a pulsed operation mode of the storage ring; transients were collected for different positions in the sensors and different X-ray beam intensities at 87 keV. Both studied sensors showed remarkable uniformity, good electron transport properties and fast charge collection for electric field strengths above 2000 V∕cm; the titanium/gold anode device showed evidence of significant bias-induced polarisation at low field strengths, while localized excess leakage current effects were observed to be more significant in the device with both platinum electrodes.
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