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| Home > Publications database > XRM2024 - Wed08K - 'Stereoscopic hard X-ray ptychography' |
| Home > Publications database > XRM2024 - Wed08K - 'Stereoscopic hard X-ray ptychography' |
| Conference Presentation | PUBDB-2026-00527 |
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2025
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Please use a persistent id in citations: doi:10.5281/zenodo.17662352 doi:10.5281/ZENODO.17662351
Abstract: Hard X-ray ptychography is often the method of choice for X-ray imaging with highest spatial resolution because of its high penetration power and versatility. Ptychography enables imaging of sample systems in extended containers, under pressure, or at specific temperatures [1, 2]. This makes ptychography a powerful tool for studying chemical systems, materials, and biological samples in situ or operando. The three-dimensional structural information of these samples is particularly useful for locating changes in space. However, limitations concerning the accessible angular range necessary for full tomographic experiments often arise when using special sample environments. Additionally, acquiring data quickly is crucial for in situ and operando studies with continuously changing samples. Multi-slice ptychography is one way to overcome these limitations. This method separates different sample layers from each other and enables imaging of optically thick samples. However, multi-slice ptychography can only obtain depth information for samples thicker than the depth of field of the imaging system [2]. Depending on the optics used and the sample being studied, multi-slicing typically requires a layer spacing of several micrometers.With our newly developed technique of stereoscopic ptychography, we can scan a sample simultaneously with two nanofocused X-rays at different angles. Similar to human vision, the stereoscopic views can considerably improve the in-depth resolution beyond the current limits of 2D imaging systems with single optics. This significantly increases the depth sensitivity of ptychography, enabling us to obtain 3D structural information from 2D scans. We performed the first stereoscopic ptychography experiment at PETRA III's P06 beamline. The mutually incoherent beams were individually focused by Fresnel zone plates and deflected by multilayer mirrors. This setup enabled imaging with a viewing angle of up to 3° at a photon energy of 8 keV. With these experimental parameters, we can distinguish sample layers separated by a few hundred nanometers. This represents an improvement in depth resolution of up to one order of magnitude compared to multi-slice ptychography.[3] References:[1] Grote, L., Seyrich, M., et al., (2022). Nature Communications, 13 (4971)[2] Kahnt, M., Grote, L., et al., (2021). Sci. Reports, 11 (1500)[3] Röper, S., Hussak, S.-A., et al., (2025). Optics Express, 33 (22755-22768)
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