000645004 001__ 645004
000645004 005__ 20260209140604.0
000645004 0247_ $$2doi$$a10.5281/ZENODO.17662351
000645004 0247_ $$2doi$$a10.5281/zenodo.17662352
000645004 0247_ $$2openalex$$aopenalex:W7125652300
000645004 037__ $$aPUBDB-2026-00527
000645004 041__ $$aEnglish
000645004 1001_ $$0P:(DE-H253)PIP1095898$$aRöper, Sina$$b0$$eCorresponding author$$udesy
000645004 1112_ $$a16th International Conference on X-Ray Microscopy$$cLund$$d2024-08-12 - 2024-08-16$$gXRM2024$$wSweden
000645004 245__ $$aXRM2024 - Wed08K - 'Stereoscopic hard X-ray ptychography'
000645004 260__ $$c2025
000645004 3367_ $$033$$2EndNote$$aConference Paper
000645004 3367_ $$2DataCite$$aOther
000645004 3367_ $$2BibTeX$$aINPROCEEDINGS
000645004 3367_ $$2DRIVER$$aconferenceObject
000645004 3367_ $$2ORCID$$aLECTURE_SPEECH
000645004 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1770125209_3159440
000645004 520__ $$aHard X-ray ptychography is often the method of choice for X-ray imaging with highest spatial resolution because of its high penetration power and versatility. Ptychography enables imaging of sample systems in extended containers, under pressure, or at specific temperatures [1, 2]. This makes ptychography a powerful tool for studying chemical systems, materials, and biological samples in situ or operando. The three-dimensional structural information of these samples is particularly useful for locating changes in space. However, limitations concerning the accessible angular range necessary for full tomographic experiments often arise when using special sample environments. Additionally, acquiring data quickly is crucial for in situ and operando studies with continuously changing samples. Multi-slice ptychography is one way to overcome these limitations. This method separates different sample layers from each other and enables imaging of optically thick samples. However, multi-slice ptychography can only obtain depth information for samples thicker than the depth of field of the imaging system [2]. Depending on the optics used and the sample being studied, multi-slicing typically requires a layer spacing of several micrometers.With our newly developed technique of stereoscopic ptychography, we can scan a sample simultaneously with two nanofocused X-rays at different angles. Similar to human vision, the stereoscopic views can considerably improve the in-depth resolution beyond the current limits of 2D imaging systems with single optics. This significantly increases the depth sensitivity of ptychography, enabling us to obtain 3D structural information from 2D scans. We performed the first stereoscopic ptychography experiment at PETRA III's P06 beamline. The mutually incoherent beams were individually focused by Fresnel zone plates and deflected by multilayer mirrors. This setup enabled imaging with a viewing angle of up to 3° at a photon energy of 8 keV. With these experimental parameters, we can distinguish sample layers separated by a few hundred nanometers. This represents an improvement in depth resolution of up to one order of magnitude compared to multi-slice ptychography.[3] References:[1] Grote, L., Seyrich, M., et al., (2022). Nature Communications, 13 (4971)[2] Kahnt, M., Grote, L., et al., (2021). Sci. Reports, 11 (1500)[3] Röper, S., Hussak, S.-A., et al., (2025). Optics Express, 33 (22755-22768)
000645004 536__ $$0G:(DE-HGF)POF4-631$$a631 - Matter – Dynamics, Mechanisms and Control (POF4-631)$$cPOF4-631$$fPOF IV$$x0
000645004 588__ $$aDataset connected to DataCite
000645004 693__ $$0EXP:(DE-H253)P-P06-20150101$$1EXP:(DE-H253)PETRAIII-20150101$$6EXP:(DE-H253)P-P06-20150101$$aPETRA III$$fPETRA Beamline P06$$x0
000645004 7001_ $$0P:(DE-H253)PIP1093030$$aHussak, Sarah-Alexandra$$b1$$udesy
000645004 7001_ $$0P:(DE-H253)PIP1017591$$aStachnik, Karolina$$b2
000645004 7001_ $$0P:(DE-H253)PIP1031321$$aKoziej, Dorota$$b3
000645004 7001_ $$0P:(DE-H253)PIP1095724$$aÅstrand, Mattias$$b4
000645004 7001_ $$0P:(DE-H253)PIP1017886$$aVogt, Ulrich$$b5
000645004 7001_ $$0P:(DE-H253)PIP1091354$$aCarus, Caterina$$b6
000645004 7001_ $$0P:(DE-H253)PIP1025514$$aHagemann, Johannes$$b7
000645004 7001_ $$0P:(DE-H253)PIP1023668$$aSeyrich, Martin$$b8$$udesy
000645004 7001_ $$0P:(DE-H253)PIP1008438$$aSchroer, Christian G.$$b9
000645004 7001_ $$0P:(DE-H253)PIP1011060$$aSchropp, Andreas$$b10
000645004 773__ $$a10.5281/zenodo.17662352
000645004 909CO $$ooai:bib-pubdb1.desy.de:645004$$pVDB
000645004 9101_ $$0I:(DE-588b)2008985-5$$6P:(DE-H253)PIP1095898$$aDeutsches Elektronen-Synchrotron$$b0$$kDESY
000645004 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1095898$$aExternal Institute$$b0$$kExtern
000645004 9101_ $$0I:(DE-588b)2008985-5$$6P:(DE-H253)PIP1093030$$aDeutsches Elektronen-Synchrotron$$b1$$kDESY
000645004 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1093030$$aExternal Institute$$b1$$kExtern
000645004 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1017591$$aExternal Institute$$b2$$kExtern
000645004 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1031321$$aExternal Institute$$b3$$kExtern
000645004 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1095724$$aExternal Institute$$b4$$kExtern
000645004 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1017886$$aExternal Institute$$b5$$kExtern
000645004 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1091354$$aExternal Institute$$b6$$kExtern
000645004 9101_ $$0I:(DE-588b)2008985-5$$6P:(DE-H253)PIP1025514$$aDeutsches Elektronen-Synchrotron$$b7$$kDESY
000645004 9101_ $$0I:(DE-588b)2008985-5$$6P:(DE-H253)PIP1023668$$aDeutsches Elektronen-Synchrotron$$b8$$kDESY
000645004 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1023668$$aEuropean XFEL$$b8$$kXFEL.EU
000645004 9101_ $$0I:(DE-588b)2008985-5$$6P:(DE-H253)PIP1008438$$aDeutsches Elektronen-Synchrotron$$b9$$kDESY
000645004 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1008438$$aEuropean XFEL$$b9$$kXFEL.EU
000645004 9101_ $$0I:(DE-588b)2008985-5$$6P:(DE-H253)PIP1011060$$aDeutsches Elektronen-Synchrotron$$b10$$kDESY
000645004 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1011060$$aEuropean XFEL$$b10$$kXFEL.EU
000645004 9131_ $$0G:(DE-HGF)POF4-631$$1G:(DE-HGF)POF4-630$$2G:(DE-HGF)POF4-600$$3G:(DE-HGF)POF4$$4G:(DE-HGF)POF$$aDE-HGF$$bForschungsbereich Materie$$lVon Materie zu Materialien und Leben$$vMatter – Dynamics, Mechanisms and Control$$x0
000645004 9141_ $$y2025
000645004 9201_ $$0I:(DE-H253)FS-PETRA-20140814$$kFS-PETRA$$lFS-PETRA$$x0
000645004 980__ $$aconf
000645004 980__ $$aVDB
000645004 980__ $$aI:(DE-H253)FS-PETRA-20140814
000645004 980__ $$aUNRESTRICTED