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@INPROCEEDINGS{Rper:645004,
      author       = {Röper, Sina and Hussak, Sarah-Alexandra and Stachnik,
                      Karolina and Koziej, Dorota and Åstrand, Mattias and Vogt,
                      Ulrich and Carus, Caterina and Hagemann, Johannes and
                      Seyrich, Martin and Schroer, Christian G. and Schropp,
                      Andreas},
      title        = {{XRM}2024 - {W}ed08{K} - '{S}tereoscopic hard {X}-ray
                      ptychography'},
      reportid     = {PUBDB-2026-00527},
      year         = {2025},
      abstract     = {Hard X-ray ptychography is often the method of choice for
                      X-ray imaging with highest spatial resolution because of its
                      high penetration power and versatility. Ptychography enables
                      imaging of sample systems in extended containers, under
                      pressure, or at specific temperatures [1, 2]. This makes
                      ptychography a powerful tool for studying chemical systems,
                      materials, and biological samples in situ or operando. The
                      three-dimensional structural information of these samples is
                      particularly useful for locating changes in space. However,
                      limitations concerning the accessible angular range
                      necessary for full tomographic experiments often arise when
                      using special sample environments. Additionally, acquiring
                      data quickly is crucial for in situ and operando studies
                      with continuously changing samples. Multi-slice ptychography
                      is one way to overcome these limitations. This method
                      separates different sample layers from each other and
                      enables imaging of optically thick samples. However,
                      multi-slice ptychography can only obtain depth information
                      for samples thicker than the depth of field of the imaging
                      system [2]. Depending on the optics used and the sample
                      being studied, multi-slicing typically requires a layer
                      spacing of several micrometers.With our newly developed
                      technique of stereoscopic ptychography, we can scan a sample
                      simultaneously with two nanofocused X-rays at different
                      angles. Similar to human vision, the stereoscopic views can
                      considerably improve the in-depth resolution beyond the
                      current limits of 2D imaging systems with single optics.
                      This significantly increases the depth sensitivity of
                      ptychography, enabling us to obtain 3D structural
                      information from 2D scans. We performed the first
                      stereoscopic ptychography experiment at PETRA III's P06
                      beamline. The mutually incoherent beams were individually
                      focused by Fresnel zone plates and deflected by multilayer
                      mirrors. This setup enabled imaging with a viewing angle of
                      up to 3° at a photon energy of 8 keV. With these
                      experimental parameters, we can distinguish sample layers
                      separated by a few hundred nanometers. This represents an
                      improvement in depth resolution of up to one order of
                      magnitude compared to multi-slice ptychography.[3]
                      References:[1] Grote, L., Seyrich, M., et al., (2022).
                      Nature Communications, 13 (4971)[2] Kahnt, M., Grote, L., et
                      al., (2021). Sci. Reports, 11 (1500)[3] Röper, S., Hussak,
                      S.-A., et al., (2025). Optics Express, 33 (22755-22768)},
      month         = {Aug},
      date          = {2024-08-12},
      organization  = {16th International Conference on X-Ray
                       Microscopy, Lund (Sweden), 12 Aug 2024
                       - 16 Aug 2024},
      cin          = {FS-PETRA},
      cid          = {I:(DE-H253)FS-PETRA-20140814},
      pnm          = {631 - Matter – Dynamics, Mechanisms and Control
                      (POF4-631)},
      pid          = {G:(DE-HGF)POF4-631},
      experiment   = {EXP:(DE-H253)P-P06-20150101},
      typ          = {PUB:(DE-HGF)6},
      doi          = {10.5281/zenodo.17662352},
      url          = {https://bib-pubdb1.desy.de/record/645004},
}