001     645004
005     20260209140604.0
024 7 _ |a 10.5281/ZENODO.17662351
|2 doi
024 7 _ |a 10.5281/zenodo.17662352
|2 doi
024 7 _ |a openalex:W7125652300
|2 openalex
037 _ _ |a PUBDB-2026-00527
041 _ _ |a English
100 1 _ |a Röper, Sina
|0 P:(DE-H253)PIP1095898
|b 0
|e Corresponding author
|u desy
111 2 _ |a 16th International Conference on X-Ray Microscopy
|g XRM2024
|c Lund
|d 2024-08-12 - 2024-08-16
|w Sweden
245 _ _ |a XRM2024 - Wed08K - 'Stereoscopic hard X-ray ptychography'
260 _ _ |c 2025
336 7 _ |a Conference Paper
|0 33
|2 EndNote
336 7 _ |a Other
|2 DataCite
336 7 _ |a INPROCEEDINGS
|2 BibTeX
336 7 _ |a conferenceObject
|2 DRIVER
336 7 _ |a LECTURE_SPEECH
|2 ORCID
336 7 _ |a Conference Presentation
|b conf
|m conf
|0 PUB:(DE-HGF)6
|s 1770125209_3159440
|2 PUB:(DE-HGF)
520 _ _ |a Hard X-ray ptychography is often the method of choice for X-ray imaging with highest spatial resolution because of its high penetration power and versatility. Ptychography enables imaging of sample systems in extended containers, under pressure, or at specific temperatures [1, 2]. This makes ptychography a powerful tool for studying chemical systems, materials, and biological samples in situ or operando. The three-dimensional structural information of these samples is particularly useful for locating changes in space. However, limitations concerning the accessible angular range necessary for full tomographic experiments often arise when using special sample environments. Additionally, acquiring data quickly is crucial for in situ and operando studies with continuously changing samples. Multi-slice ptychography is one way to overcome these limitations. This method separates different sample layers from each other and enables imaging of optically thick samples. However, multi-slice ptychography can only obtain depth information for samples thicker than the depth of field of the imaging system [2]. Depending on the optics used and the sample being studied, multi-slicing typically requires a layer spacing of several micrometers.With our newly developed technique of stereoscopic ptychography, we can scan a sample simultaneously with two nanofocused X-rays at different angles. Similar to human vision, the stereoscopic views can considerably improve the in-depth resolution beyond the current limits of 2D imaging systems with single optics. This significantly increases the depth sensitivity of ptychography, enabling us to obtain 3D structural information from 2D scans. We performed the first stereoscopic ptychography experiment at PETRA III's P06 beamline. The mutually incoherent beams were individually focused by Fresnel zone plates and deflected by multilayer mirrors. This setup enabled imaging with a viewing angle of up to 3° at a photon energy of 8 keV. With these experimental parameters, we can distinguish sample layers separated by a few hundred nanometers. This represents an improvement in depth resolution of up to one order of magnitude compared to multi-slice ptychography.[3] References:[1] Grote, L., Seyrich, M., et al., (2022). Nature Communications, 13 (4971)[2] Kahnt, M., Grote, L., et al., (2021). Sci. Reports, 11 (1500)[3] Röper, S., Hussak, S.-A., et al., (2025). Optics Express, 33 (22755-22768)
536 _ _ |a 631 - Matter – Dynamics, Mechanisms and Control (POF4-631)
|0 G:(DE-HGF)POF4-631
|c POF4-631
|f POF IV
|x 0
588 _ _ |a Dataset connected to DataCite
693 _ _ |a PETRA III
|f PETRA Beamline P06
|1 EXP:(DE-H253)PETRAIII-20150101
|0 EXP:(DE-H253)P-P06-20150101
|6 EXP:(DE-H253)P-P06-20150101
|x 0
700 1 _ |a Hussak, Sarah-Alexandra
|0 P:(DE-H253)PIP1093030
|b 1
|u desy
700 1 _ |a Stachnik, Karolina
|0 P:(DE-H253)PIP1017591
|b 2
700 1 _ |a Koziej, Dorota
|0 P:(DE-H253)PIP1031321
|b 3
700 1 _ |a Åstrand, Mattias
|0 P:(DE-H253)PIP1095724
|b 4
700 1 _ |a Vogt, Ulrich
|0 P:(DE-H253)PIP1017886
|b 5
700 1 _ |a Carus, Caterina
|0 P:(DE-H253)PIP1091354
|b 6
700 1 _ |a Hagemann, Johannes
|0 P:(DE-H253)PIP1025514
|b 7
700 1 _ |a Seyrich, Martin
|0 P:(DE-H253)PIP1023668
|b 8
|u desy
700 1 _ |a Schroer, Christian G.
|0 P:(DE-H253)PIP1008438
|b 9
700 1 _ |a Schropp, Andreas
|0 P:(DE-H253)PIP1011060
|b 10
773 _ _ |a 10.5281/zenodo.17662352
909 C O |o oai:bib-pubdb1.desy.de:645004
|p VDB
910 1 _ |a Deutsches Elektronen-Synchrotron
|0 I:(DE-588b)2008985-5
|k DESY
|b 0
|6 P:(DE-H253)PIP1095898
910 1 _ |a External Institute
|0 I:(DE-HGF)0
|k Extern
|b 0
|6 P:(DE-H253)PIP1095898
910 1 _ |a Deutsches Elektronen-Synchrotron
|0 I:(DE-588b)2008985-5
|k DESY
|b 1
|6 P:(DE-H253)PIP1093030
910 1 _ |a External Institute
|0 I:(DE-HGF)0
|k Extern
|b 1
|6 P:(DE-H253)PIP1093030
910 1 _ |a External Institute
|0 I:(DE-HGF)0
|k Extern
|b 2
|6 P:(DE-H253)PIP1017591
910 1 _ |a External Institute
|0 I:(DE-HGF)0
|k Extern
|b 3
|6 P:(DE-H253)PIP1031321
910 1 _ |a External Institute
|0 I:(DE-HGF)0
|k Extern
|b 4
|6 P:(DE-H253)PIP1095724
910 1 _ |a External Institute
|0 I:(DE-HGF)0
|k Extern
|b 5
|6 P:(DE-H253)PIP1017886
910 1 _ |a External Institute
|0 I:(DE-HGF)0
|k Extern
|b 6
|6 P:(DE-H253)PIP1091354
910 1 _ |a Deutsches Elektronen-Synchrotron
|0 I:(DE-588b)2008985-5
|k DESY
|b 7
|6 P:(DE-H253)PIP1025514
910 1 _ |a Deutsches Elektronen-Synchrotron
|0 I:(DE-588b)2008985-5
|k DESY
|b 8
|6 P:(DE-H253)PIP1023668
910 1 _ |a European XFEL
|0 I:(DE-588)1043621512
|k XFEL.EU
|b 8
|6 P:(DE-H253)PIP1023668
910 1 _ |a Deutsches Elektronen-Synchrotron
|0 I:(DE-588b)2008985-5
|k DESY
|b 9
|6 P:(DE-H253)PIP1008438
910 1 _ |a European XFEL
|0 I:(DE-588)1043621512
|k XFEL.EU
|b 9
|6 P:(DE-H253)PIP1008438
910 1 _ |a Deutsches Elektronen-Synchrotron
|0 I:(DE-588b)2008985-5
|k DESY
|b 10
|6 P:(DE-H253)PIP1011060
910 1 _ |a European XFEL
|0 I:(DE-588)1043621512
|k XFEL.EU
|b 10
|6 P:(DE-H253)PIP1011060
913 1 _ |a DE-HGF
|b Forschungsbereich Materie
|l Von Materie zu Materialien und Leben
|1 G:(DE-HGF)POF4-630
|0 G:(DE-HGF)POF4-631
|3 G:(DE-HGF)POF4
|2 G:(DE-HGF)POF4-600
|4 G:(DE-HGF)POF
|v Matter – Dynamics, Mechanisms and Control
|x 0
914 1 _ |y 2025
920 1 _ |0 I:(DE-H253)FS-PETRA-20140814
|k FS-PETRA
|l FS-PETRA
|x 0
980 _ _ |a conf
980 _ _ |a VDB
980 _ _ |a I:(DE-H253)FS-PETRA-20140814
980 _ _ |a UNRESTRICTED


LibraryCollectionCLSMajorCLSMinorLanguageAuthor
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