| Home > Publications database > Local-stress-mediated deformation and fracture in Ti-Al layered metals: A synchrotron and CPFEM study |
| Journal Article | PUBDB-2026-00088 |
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2025
Elsevier
Amsterdam
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Please use a persistent id in citations: doi:10.1016/j.msea.2025.149063 doi:10.3204/PUBDB-2026-00088
Abstract: Layered metals (LMs), as a prototypical heterostructured material, have garnered considerable attention due to their ability to achieve excellent strength-ductility synergy. Due to the distinct mechanical properties of the component layers, the local stress in each layer often deviates from the macroscopic applied stress. In this study, synchrotron-based X-ray microdiffraction with micrometer resolution in one beam dimension was conducted. The local stress evolution in Ti-Al LM upon uniaxial applied stress was tracked via synchrotron high-energy X-ray microdiffraction (μHEXRD). Meanwhile, deformation and fracture were characterized in detail by SEM, EBSD, and synchrotron Laue X-ray microdiffraction (μLXRD). Such detailed experimental studies revealed the local stress evolution in Ti-Al LM follows four stages, and the deformation and fracture of the layers differed from those of free-standing counterparts. The effects of local stress on deformation and fracture were discussed with the aid of the crystal plasticity finite element method (CPFEM), elucidating the slip system activation from the view of resolved shear stress and the intergranular fracture from the view of stress triaxiality. This work contributes to the fundamental understanding of the mechanical behaviors of LMs and offers guidance for designing high-performance LMs.
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