Home > Publications database > Single-shot temporal characterization with the transverse deflecting structure PolariX and THz streaking at FLASH |
Journal Article/Contribution to a conference proceedings | PUBDB-2025-02440 |
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2025
IOP Publ.
Bristol
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Please use a persistent id in citations: doi:10.1088/1742-6596/3010/1/012140 doi:10.3204/PUBDB-2025-02440
Abstract: At the free electron laser FLASH at DESY pulse length measurements can be performed with e.g. THz streaking or an analysis using the PolariX TDS. Since THz streaking examines the XUV pulse directly whereas the PolariX TDS focuses on the energy distribution of the (XUV pulse generating) electron bunch, both techniques are capable of analyzing the same XUV pulse simultaneously. We used a newly installed laser heater to shape the electron bunch and therefore influence the XUV pulse profile and compare the resulting pulse shapes measured by THz streaking and the PolariX TDS. We compare average pulse profiles as well as single-shot examples and discuss the challenges of both types of analysis.
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Book/Proceedings
Synchrotron radiation instrumentation: proceedings, 15th international conference, SR>I 2024, Hamburg, Germany August 26-30, 2024
15th International Conference on Synchrotron Radiation Instrumentation, SRI 2024, HamburgHamburg, Germany, 26 Aug 2024 - 30 Aug 2024
Bristol, UK : IOP Publishing Ltd, Journal of Physics: Conference Series 3010 (2025), nonconsec. pag. (2025)
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