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Journal Article | PUBDB-2025-02414 |
; ; ; ;
2025
Inst.
Woodbury, NY
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Please use a persistent id in citations: doi:10.1103/PhysRevB.111.024105 doi:10.3204/PUBDB-2025-02414
Abstract: Kinetics of order-disorder transitions including melting in low-dimensional systems is theoretically predicted to be heterogeneous that start by nucleation in defect sites at lower than homogeneous bulk-melting temperature requiring substantially lower energy barrier. We probed kinetics of such transition in thin multilayered films using x-ray scattering and in situ atomic force microscopy (AFM) studies. X-ray results show linear increase with time in in-plane separation of ordered domains while in situ AFM measurements show a linear increase in height of disordered domains with time. The structure factor of the diffraction peak reduces linearly with square of time as the material disorder.
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