Journal Article

PUBDB-2025-01838

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Femtosecond X-ray cross-correlation analysis of disordered crystals forming in a supercooled atomic liquid

Moeller, J. (Corresponding author)XFEL.EU* ; Caresana, M. ; Schottelius, A. ; Lehmkühler, F.XFEL.EU*DESY* ; Boesenberg, U. ; Caupin, F. ; Dallari, F. ; Ezquerra, T. A. ; Fernández, J. M. ; Gelisio, L. ; Goy, C. ; Hallmann, J. ; Kalinin, A. ; Kim, C. ; Kurta, R. P. ; Lapkin, D. ; Mambretti, F. ; Scholz, M. ; Shayduk, R. ; Steinbrügge, R.Extern*DESY* ; Trinter, F.Extern*XFEL.EU* ; Vartanyants, I. A.Extern*XFEL.EU*DESY* ; Zozulya, A.XFEL.EU* ; Galli, D. E. ; Grübel, G. ; Madsen, A. ; Grisenti, R. E. (Corresponding author)Extern*XFEL.EU*

2025
[Verlag nicht ermittelbar] Chester

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Please use a persistent id in citations: doi:10.1107/S2052252525004063  doi:10.3204/PUBDB-2025-01838

Abstract: We demonstrate an advanced scattering method for accessing the 3D reciprocalspace of crystalline structures forming in a rapidly supercooled noble-gas liquidusing a combination of femtosecond X-ray diffraction and X-ray cross-corre-lation analysis. The preservation of angular information from the scatteringsignal allows probing the structure factor along selected directions in reciprocalspace and identifying signatures undetectable in azimuthally integrated scat-tering curves. Therefore, more information from serial diffraction experimentson stochastic crystallization processes can be retrieved despite the inherentvariation of the crystal orientation and morphology for each single probe. Wealso demonstrate how different features in the correlation maps can be asso-ciated with certain forms of stacking faults, which enables studying such defectsin situ and disentangling them from simultaneous changes in crystal size andtemperature.

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Contributing Institute(s):

1. MID (XFEL_E1_MID)
2. PETRA-S (FS-PETRA-S)
3. Instrument Electronics MID (XFEL_E1_MID_IE)
4. DOOR-User (DOOR ; HAS-User)
5. Spectroscopy of molecular processes (FS-SMP)

Research Program(s):

1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)
2. 6G13 - Accelerator of European XFEL (POF4-6G13) (POF4-6G13)
3. 6G3 - PETRA III (DESY) (POF4-6G3) (POF4-6G3)
4. DFG project G:(GEPRIS)499455518 - Untersuchung früher Kristallisationsstadien in unterkühlten atomaren Flüssigkeiten durch zeitaufgelöste Röntgenstreuung von mikroskopischen laminaren Strahlen in Verbindung mit einer auf maschinellem Lernen basierenden Datenanalyse. (499455518) (499455518)
5. AIM, DFG project G:(GEPRIS)390715994 - EXC 2056: CUI: Advanced Imaging of Matter (390715994) (390715994)
6. DFG project G:(GEPRIS)509471550 - Dynamik photoionisations-induzierter Prozesse in laser-präparierten Molekülen in der Gasphase und der wässrigen Phase (509471550) (509471550)
7. FS-Proposal: I-20170858 (I-20170858) (I-20170858)

Experiment(s):

1. Experiments at XFEL
2. PETRA Beamline P01 (PETRA III)
3. MID: Materials Imaging and Dynamics (SASE2)

Appears in the scientific report 2025

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