Journal Article

PUBDB-2025-00680

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Dark-field x-ray microscopy for 2D and 3D imaging of microstructural dynamics at the European x-ray free-electron laser

Irvine, S. J. ; Katagiri, K. ; Ræder, T. M. ; Boesenberg, U. ; Chalise, D. ; Stanton, J. I. ; Pal, D. ; Hallmann, J. ; Ansaldi, G. ; Brauße, F. ; Eggert, J. H. ; Fang, L. ; Folsom, E. ; Haubro, M. ; Holstad, T. S. ; Madsen, A. ; Möller, J. ; Nielsen, M. M. ; Poulsen, H. F. ; Pudell, J.-E. ; Rodriguez-Fernandez, A. ; Schoofs, F. ; Seiboth, F.XFEL.EU*DESY* ; Wang, Y. ; Jo, W. ; Youssef, M. ; Zozulya, A.XFEL.EU* ; Haldrup, K. ; Dresselhaus-Marais, L. E. (Corresponding author)Extern*XFEL.EU*

2025
American Inst. of Physics Melville, NY

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Please use a persistent id in citations: doi:10.1063/5.0239034  doi:10.3204/PUBDB-2025-00680

Abstract: Dark field x-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond x-ray pulses generated by x-ray free-electron lasers (XFELs), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically driven longitudinal strain wave propagating through a diamond single crystal. We also present two DFXM scanning modalities that are new to the XFEL sources: spatial 3D and 2D axial-strain scans with sub-μm spatial resolution. With this progress in XFEL-based DFXM, we discuss new opportunities to study multi-timescale spatiotemporal dynamics of microstructures.

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Contributing Institute(s):

1. FS-PETRA (FS-PETRA)
2. MID (XFEL_E1_MID)
3. The European XFEL Users (XFEL-User)

Research Program(s):

1. 631 - Matter – Dynamics, Mechanisms and Control (POF4-631) (POF4-631)
2. PMP - The Physics of Metal Plasticity (885022) (885022)

Experiment(s):

1. MID: Materials Imaging and Dynamics (SASE2)

Appears in the scientific report 2025

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; National-Konsortium ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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