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@ARTICLE{Irvine:623255,
      author       = {Irvine, Sara J. and Katagiri, Kento and Ræder, Trygve M.
                      and Boesenberg, Ulrike and Chalise, Darshan and Stanton,
                      Jade I. and Pal, Dayeeta and Hallmann, Jörg and Ansaldi,
                      Gabriele and Brauße, Felix and Eggert, Jon H. and Fang,
                      Lichao and Folsom, Eric and Haubro, Morten and Holstad,
                      Theodor S. and Madsen, Anders and Möller, Johannes and
                      Nielsen, Martin M. and Poulsen, Henning F. and Pudell,
                      Jan-Etienne and Rodriguez-Fernandez, Angel and Schoofs,
                      Frank and Seiboth, Frank and Wang, Yifan and Jo, Wonhyuk and
                      Youssef, Mohamed and Zozulya, Alexey and Haldrup, Kristoffer
                      and Dresselhaus-Marais, Leora E.},
      title        = {{D}ark-field x-ray microscopy for 2{D} and 3{D} imaging of
                      microstructural dynamics at the {E}uropean x-ray
                      free-electron laser},
      journal      = {Journal of applied physics},
      volume       = {137},
      number       = {5},
      issn         = {0021-8979},
      address      = {Melville, NY},
      publisher    = {American Inst. of Physics},
      reportid     = {PUBDB-2025-00680},
      pages        = {053106},
      year         = {2025},
      abstract     = {Dark field x-ray microscopy (DXFM) can visualize
                      microstructural distortions in bulk crystals. Using the
                      femtosecond x-ray pulses generated by x-ray free-electron
                      lasers (XFELs), DFXM can achieve sub-μm spatial resolution
                      and <100 fs time resolution simultaneously. In this paper,
                      we demonstrate ultrafast DFXM measurements at the European
                      XFEL to visualize an optically driven longitudinal strain
                      wave propagating through a diamond single crystal. We also
                      present two DFXM scanning modalities that are new to the
                      XFEL sources: spatial 3D and 2D axial-strain scans with
                      sub-μm spatial resolution. With this progress in XFEL-based
                      DFXM, we discuss new opportunities to study multi-timescale
                      spatiotemporal dynamics of microstructures.},
      cin          = {FS-PETRA / $XFEL_E1_MID$ / XFEL-User},
      ddc          = {530},
      cid          = {I:(DE-H253)FS-PETRA-20140814 /
                      $I:(DE-H253)XFEL_E1_MID-20210408$ /
                      I:(DE-H253)XFEL-User-20170713},
      pnm          = {631 - Matter – Dynamics, Mechanisms and Control
                      (POF4-631) / PMP - The Physics of Metal Plasticity (885022)},
      pid          = {G:(DE-HGF)POF4-631 / G:(EU-Grant)885022},
      experiment   = {EXP:(DE-H253)XFEL-MID-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:001418756000004},
      doi          = {10.1063/5.0239034},
      url          = {https://bib-pubdb1.desy.de/record/623255},
}