Journal Article

PUBDB-2023-07657

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png The application of encoder–decoder neural networks in high accuracy and efficiency slit-scan emittance measurements

Ma, S. (Corresponding author)Extern* ; Arnold, A. ; Michel, P. ; Murcek, P. ; Ryzhov, A. ; Schaber, J. ; Steinbrück, R. ; Evtushenko, P. ; Teichert, J. (Corresponding author)Extern* ; Hillert, W.CFEL*Extern* ; Xiang, R. ; Zhu, J.Extern*DESY*

2023
North-Holland Publ. Co. Amsterdam

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Please use a persistent id in citations: doi:10.1016/j.nima.2023.168125  doi:10.3204/PUBDB-2023-07657

Report No.: arXiv:2207.09144

Abstract: A superconducting radio-frequency (SRF) photo injector is in operation at the electron linac for beams with high brilliance and low emittance (ELBE) radiation center and generates continuous wave (CW) electron beams with high average current and high brightness for user operation since 2018. The speed of emittance measurement at the SRF gun beamline can be increased by improving the slit-scan system, thus the measurement time for one phase space mapping can be shortened from about 15 min to 90 s. The convolution neural networks are applied to improve the efficiency and accuracy of beamlet images processing. In order to estimate the uncertainty in the calculation of normalized emittance, we analyze the main error contributions.

Keyword(s): SRF photo injectors ; Beam emittance ; Slit-scan ; Machine learning

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Contributing Institute(s):

1. Centre f. Quantum Techno. a. Application (CQTA)

Research Program(s):

1. 611 - Fundamental Particles and Forces (POF4-611) (POF4-611)

Experiment(s):

1. No specific instrument

Appears in the scientific report 2023

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Web of Science Core Collection

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Linked articles:

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Preprint Ma, S. (Corresponding author) ; Arnold, A. ; Michel, P. ; Murcek, P. ; Ryzhov, A. ; Schaber, J. ; Steinbrück, R. ; Evtushenko, P. ; Teichert, J.-H. (Corresponding author)DESY* ; Hillert, W.DESY* ; Xiang, R. ; Zhu, J.DESY*
The application of machine learning in high accuracy and efficiency slit-scan emittance measurements
[10.3204/PUBDB-2022-04155]     Files  Fulltext by arXiv.org BibTeX | EndNote: XML, Text | RIS

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