Journal Article

PUBDB-2023-06296

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Femtosecond Reduction of Atomic Scattering Factors Triggered by Intense X-Ray Pulse

Inoue, I. (Corresponding author)Extern*XFEL.EU* ; Yamada, J. ; Kapcia, K. J. ; Stransky, M. ; Tkachenko, V.XFEL.EU*DESY* ; Jurek, Z.CFEL*DESY* ; Inoue, T. ; Osaka, T. ; Inubushi, Y. ; Ito, A. ; Tanaka, Y. ; Matsuyama, S. ; Yamauchi, K. ; Yabashi, M. ; Ziaja, B. (Corresponding author)CFEL*XFEL.EU*DESY*

2023
APS College Park, Md.

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Please use a persistent id in citations: doi:10.1103/PhysRevLett.131.163201  doi:10.3204/PUBDB-2023-06296

Abstract: X-ray diffraction of silicon irradiated with tightly focused femtosecond x-ray pulses (photon energy, 11.5 keV; pulse duration, 6 fs) was measured at various x-ray intensities up to 4.6 × 10$^{19}$  W/cm$^2$. The measurement reveals that the diffraction intensity is highly suppressed when the x-ray intensity reaches of the order of 10$^{19}$  W/cm$^2$. With a dedicated simulation, we confirm that the observed reduction of the diffraction intensity can be attributed to the femtosecond change in individual atomic scattering factors due to the ultrafast creation of highly ionized atoms through photoionization, Auger decay, and subsequent collisional ionization. We anticipate that this ultrafast reduction of atomic scattering factor will be a basis for new x-ray nonlinear techniques, such as pulse shortening and contrast variation x-ray scattering.

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Contributing Institute(s):

1. FS-CFEL-3 (CFEL-DESYT)
2. CFEL-Theory (FS-CFEL-3)
3. Gruppe CFEL-XM (FS-CFEL-XM)

Research Program(s):

1. 631 - Matter – Dynamics, Mechanisms and Control (POF4-631) (POF4-631)

Experiment(s):

1. No specific instrument

Appears in the scientific report 2023

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF >= 5 ; JCR ; Nationallizenz ; SCOPUS ; Web of Science Core Collection

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