Journal Article

PUBDB-2021-04057

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Determination of the Exact Orientation of Single-Crystal X-ray Optics from Its Glitch Spectrum and Modeling of Glitches for an Arbitrary Configuration

Klimova, N. (Corresponding author)Extern* ; Yefanov, O.CFEL*DESY* ; Snigireva, I.Extern* ; Snigirev, A.Extern*

2021
MDPI Basel

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Please use a persistent id in citations: doi:10.3390/cryst11050504  doi:10.3204/PUBDB-2021-04057

Abstract: X-ray optics made of single-crystal materials are widely used at most of the X-ray sources due to the outstanding properties. The main drawback of such optics—the diffraction losses, also known as glitches of intensity in the energy spectrum of the transmitted/diffracted beam. To be able to handle this negative effect, one needs a reliable way to simulate the glitch spectrum in any configuration. Here, we demonstrate the way of precisely determining the crystallographic orientation and unit cell parameters of optical elements just from a small glitch spectrum with the consequent possibility of simulating glitches for any energy.

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Contributing Institute(s):

1. CFEL-Coherent X-Ray Imaging (FS-CFEL-1)

Research Program(s):

1. 631 - Matter – Dynamics, Mechanisms and Control (POF4-631) (POF4-631)

Experiment(s):

1. No specific instrument

Appears in the scientific report 2021

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