| Home > Publications database > Quantifying Angular Correlations between the Atomic Lattice and the Superlattice of Nanocrystals Assembled with Directional Linking |
| Journal Article | PUBDB-2017-05074 |
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2017
ACS Publ.
Washington, DC
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Please use a persistent id in citations: doi:10.1021/acs.nanolett.7b00584 doi:10.3204/PUBDB-2017-05074
Abstract: We show that the combination of X-ray scatteringwith a nanofocused beam and X-ray cross correlation analysis is anefficient way for the full structural characterization of mesocrystallinenanoparticle assemblies with a single experiment. We analyze severalhundred diffraction patterns at individual sample locations, that is,individual grains, to obtain a meaningful statistical distribution of thesuperlattice and atomic lattice ordering. Simultaneous small- andwide-angle X-ray scattering of the same sample location allows us todetermine the structure and orientation of the superlattice as well asthe angular correlation of the first two Bragg peaks of the atomiclattices, their orientation with respect to the superlattice, and the average orientational misfit due to local structural disorder. Thisexperiment is particularly advantageous for synthetic mesocrystals made by the simultaneous self-assembly of nanocrystals andsurface-functionalization with conductive ligands. While the structural characterization of such materials has been challenging sofar, the present method now allows correlating the mesocrystalline structure with optoelectronic properties.
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