Journal Article

PUBDB-2016-06673

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Investigation of morphological degradation of P3HT:PCBM bulk heterojunction films exposed to long-term host solvent vapor

Wang, W.Extern* ; Guo, S.Extern* ; Herzig, E.Extern* ; Sarkar, K.Extern* ; Schindler, M.Extern* ; Magerl, D.Extern* ; Philipp, M.Extern* ; Perlich, J.DESY* ; Müller-Buschbaum, P. (Corresponding author)Extern*

2016
RSC London [u.a.]

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Please use a persistent id in citations: doi:10.1039/C5TA09873D

Abstract: Solution-based processing procedures are widely used during the fabrication of polymer solar cells both on the lab scale and in industrial applications. The understanding of device stability in its host solvent vapor atmosphere is of great significance to the fabrication, encapsulation and storage. Solar cells with poly(3-hexylthiophene):[6,6]-phenyl-C61 butyric acid methyl ester (P3HT:PCBM) bulk heterojunction (BHJ) active layers are prepared with different solvents of chlorobenzene, toluene, xylene and dichlorobenzene. The stability is investigated via exposure to their respective host solvent vapor for a long period. All solar cells strongly degrade after exposure to solvent vapor for long-term and only the dichlorobenzene-related device still shows reasonable function. The morphology of P3HT:PCBM BHJ films is probed using optical microscopy, atomic force microscopy, grazing incidence small and wide angle X-ray scattering and absorption measurements. The solvent induced PCBM crystallization is identified as the main reason for device failure.

Note: © The Royal Society of Chemistry ; Post referee fulltext in progress 2; Embargo 12 months from publication

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Contributing Institute(s):

1. DOOR-User (DOOR)
2. FS-Experimentebetreuung DORIS (FS-DO)

Research Program(s):

1. 6214 - Nanoscience and Materials for Information Technology (POF3-621) (POF3-621)

Experiment(s):

1. DORIS Beamline BW4 (DORIS III)
2. DORIS Beamline BW2 (DORIS III)

Appears in the scientific report 2016

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Database coverage:
; Allianz-Lizenz / DFG ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; IF >= 5 ; JCR ; No Authors Fulltext ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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