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@ARTICLE{Wang:316500,
      author       = {Wang, Weijia and Guo, Shuai and Herzig, Eva and Sarkar,
                      Kuhu and Schindler, Markus and Magerl, David and Philipp,
                      Martine and Perlich, Jan and Müller-Buschbaum, Peter},
      title        = {{I}nvestigation of morphological degradation of
                      {P}3{HT}:{PCBM} bulk heterojunction films exposed to
                      long-term host solvent vapor},
      journal      = {Journal of materials chemistry / A},
      volume       = {4},
      number       = {10},
      issn         = {2050-7496},
      address      = {London [u.a.]},
      publisher    = {RSC},
      reportid     = {PUBDB-2016-06673},
      pages        = {3743 - 3753},
      year         = {2016},
      note         = {© The Royal Society of Chemistry ; Post referee fulltext
                      in progress 2; Embargo 12 months from publication},
      abstract     = {Solution-based processing procedures are widely used during
                      the fabrication of polymer solar cells both on the lab scale
                      and in industrial applications. The understanding of device
                      stability in its host solvent vapor atmosphere is of great
                      significance to the fabrication, encapsulation and storage.
                      Solar cells with poly(3-hexylthiophene):[6,6]-phenyl-C61
                      butyric acid methyl ester (P3HT:PCBM) bulk heterojunction
                      (BHJ) active layers are prepared with different solvents of
                      chlorobenzene, toluene, xylene and dichlorobenzene. The
                      stability is investigated via exposure to their respective
                      host solvent vapor for a long period. All solar cells
                      strongly degrade after exposure to solvent vapor for
                      long-term and only the dichlorobenzene-related device still
                      shows reasonable function. The morphology of P3HT:PCBM BHJ
                      films is probed using optical microscopy, atomic force
                      microscopy, grazing incidence small and wide angle X-ray
                      scattering and absorption measurements. The solvent induced
                      PCBM crystallization is identified as the main reason for
                      device failure.},
      cin          = {DOOR / FS-DO},
      ddc          = {540},
      cid          = {I:(DE-H253)HAS-User-20120731 / I:(DE-H253)FS-DO-20120731},
      pnm          = {6214 - Nanoscience and Materials for Information Technology
                      (POF3-621)},
      pid          = {G:(DE-HGF)POF3-6214},
      experiment   = {EXP:(DE-H253)D-BW4-20150101 / EXP:(DE-H253)D-BW2-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000371967000019},
      doi          = {10.1039/C5TA09873D},
      url          = {https://bib-pubdb1.desy.de/record/316500},
}