Journal Article

PUBDB-2016-05569

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Quantitative characterization of aberrations in X-ray optics

Khounsary, A. M. (Editor) ; Goto, S. (Editor) ; Morawe, C. (Editor) ; Seiboth, F. (Corresponding author)DESY* ; Kahnt, M.DESY* ; Scholz, M.DESY* ; Seyrich, M.DESY* ; Wittwer, F.DESY* ; Garrevoet, J.DESY* ; Falkenberg, G.DESY* ; Schropp, A.DESY* ; Schroer, C.DESY*

2016
SPIE Bellingham, Wash.

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Please use a persistent id in citations: doi:10.1117/12.2237646  doi:10.3204/PUBDB-2016-05569

Abstract: Due to the weak interaction of X-rays with matter and their small wavelength on the atomic scale, stringent requirements are put on X-ray optics manufacturing and metrology. As a result, these optics often suffer from aberrations. Until now, X-ray optics were mainly characterized by their focal spot size and efficiency. How- ever, both measures provide only insufficient information about optics quality. Here, we present a quantitative analysis of residual aberrations in current beryllium compound refractive lenses using ptychography followed by a determination of the wavefront error and subsequent Zernike polynomial decomposition. Known from visible light optics, we show that these measures can provide an adequate tool to determine and compare the quality of various X-ray optics.

Note: (c) SPIE

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Contributing Institute(s):

1. FS-PETRA (FS-PETRA)
2. Experimentebetreuung PETRA III (FS-PE)

Research Program(s):

1. 6214 - Nanoscience and Materials for Information Technology (POF3-621) (POF3-621)
2. 6G3 - PETRA III (POF3-622) (POF3-622)
3. 05K13OD2 - Erzeugung und Charakterisierung von nanofokussierten XFEL-Pulsen zur Abbildung ultraschneller Prozesse in Materie (BMBF-05K13OD2) (BMBF-05K13OD2)

Experiment(s):

1. PETRA Beamline P06 (PETRA III)
2. Measurement at external facility

Appears in the scientific report 2016

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Database coverage:
; ; Allianz-Lizenz / DFG

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