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Bond stretching force constants in (In,Ga)P

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2015

16th International Conference on X-ray Absorption Fine Structure Spectroscopy, XAFS16, KarlsruheKarlsruhe, Germany, 23 Aug 2015 - 28 Aug 20152015-08-232015-08-28  GO

Abstract: Bond stretching force constants determine fundamental properties of mixed semiconductors. In this study, (In,Ga)P grown by metal organic chemical vapour deposition was investigated using extended X-ray absorption fine structure spectroscopy. Measurements at the Ga K edge were performed at ten different temperatures to determine the bond length variation as a function of temperature. Utilizing an Einstein model, the bond stretching force constant of the Ga-P-bond in (In,Ga)P was determined. It decreases with increasing indium content, meaning that bond stretching force constants determined for binary III-V-semiconductors may not be readily transferable to ternary systems.


Contributing Institute(s):
  1. DOOR-User (DOOR)
Research Program(s):
  1. 899 - ohne Topic (POF3-899) (POF3-899)
  2. FS-Proposal: I-20110408 (I-20110408) (I-20110408)
Experiment(s):
  1. DORIS Beamline C (DORIS III)

Appears in the scientific report 2015
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 Record created 2016-02-19, last modified 2018-04-24



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