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Poster | PUBDB-2016-01127 |
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2015
Abstract: Bond stretching force constants determine fundamental properties of mixed semiconductors. In this study, (In,Ga)P grown by metal organic chemical vapour deposition was investigated using extended X-ray absorption fine structure spectroscopy. Measurements at the Ga K edge were performed at ten different temperatures to determine the bond length variation as a function of temperature. Utilizing an Einstein model, the bond stretching force constant of the Ga-P-bond in (In,Ga)P was determined. It decreases with increasing indium content, meaning that bond stretching force constants determined for binary III-V-semiconductors may not be readily transferable to ternary systems.
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