FS-Proposal: II-20032053 EC

IdentifierG:(DE-H253)II-20032053-EC

 

Recent Publications

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Study of Relaxation of Strain in Patterned Structures using X-Ray Diffraction Technique
Semiconductor science and technology 22, 1-4 () [10.1088/0268-1242/22/1/S50]  GO OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Study of Relaxation of Strain in Patterned Structures using X-Ray Diffraction Technique
3rd International SiGe Technology and Device Meeting, ISTDM 2006, PrincetonPrinceton, USA, 15 May 2006 - 17 May 20062006-05-152006-05-17 IOP Publishing ()  GO BibTeX | EndNote: XML, Text | RIS

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 Record created 2014-10-31, last modified 2015-05-07



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