Journal Article

DESY-2014-02181

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Crystallography under External Electric Field

Gorfman, S. (Corresponding author)Extern* ; Schmidt, O.Extern* ; Tsirelson, V. ; Ziolkowski, M.Extern* ; Pietsch, U.Extern*

2013
Wiley-VCH Weinheim

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Please use a persistent id in citations: doi:10.1002/zaac.201200497  doi:10.3204/DESY-2014-02181

Abstract: Structural response of crystals to an applied external perturbation is important as a key for understanding microscopic origin of physical properties. Experimental investigation of structural response is a great challenge for modern structure analysis. We demonstrate how advanced X-ray diffraction techniques facilitate probing tiny (10–4 Å) distortions of bond lengths under a permanent electric field. We also discuss details of the experimental procedure essential for reaching such precision. We ask whether the experiment can be used to evaluate chemical bonds in crystals by their sensitivity to an external electric field and discuss if the bond deformations can be predicted using the bond-valence model or the Bader's theory of atoms in molecules and crystals. Finally, we describe the new time-resolved studies of a structural response to a dynamical switch of applied electric field. These results give access to the time-lining of piezoelectric effect on a microsecond time scale.

Note: © WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim

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Contributing Institute(s):

1. DOOR-User (DOOR)

Research Program(s):

1. DORIS Beamline D3 (POF2-54G13) (POF2-54G13)

Experiment(s):

1. DORIS Beamline D3 (DORIS III)

Appears in the scientific report 2013

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Database coverage:
; Current Contents - Social and Behavioral Sciences ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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