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Multireflection grazing incidence diffraction used for stress measurements in surface layers
Marciszko, M. (Corresponding author)Extern*HAS-User, Extern* ; Baczmanski, A.Extern*HAS-User, Extern* ; Wrobel, M.Extern*HAS-User, Extern* ; wilfrid, s.Extern*HAS-User, Extern* ; braham, c.Extern*HAS-User, Extern* ; Donges, J.Extern*DESY*HAS-User, Extern* ; Sniechowski, M.Extern*HAS-User, Extern* ; Krzysztof, W.
2013
Elsevier
Amsterdam [u.a.]
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Please use a persistent id in citations: doi:10.1016/j.tsf.2012.05.042
Note: © Elsevier B.V. ; Post referee fulltext in progress; Embargo 12 months from publication
Contributing Institute(s):
- DOOR-User (DOOR)
- FS-Experimentebetreuung DORIS (FS-DO)
- Experiments with synchrotron radiation (HASYLAB(-2012))
Research Program(s):
- DORIS Beamline G3 (POF2-54G13) (POF2-54G13)
Experiment(s):
- DORIS Beamline G3 (DORIS III)
Appears in the scientific report
2013
Database coverage:
; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; JCR ; Nationallizenz

; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection