TY  - JOUR
AU  - Marciszko, Marianna
AU  - Baczmanski, Andrzej
AU  - Wrobel, Miroslaw
AU  - wilfrid, seiler
AU  - braham, chedly
AU  - Donges, Joern
AU  - Sniechowski, Maciej
AU  - Krzysztof, Wierzbanowski
TI  - Multireflection grazing incidence diffraction used for stress measurements in surface layers
JO  - Thin solid films
VL  - 530
SN  - 0040-6090
CY  - Amsterdam [u.a.]
PB  - Elsevier
M1  - DESY-2013-00743
SP  - 81-84
PY  - 2013
N1  - © Elsevier B.V. ; Post referee fulltext in progress; Embargo 12 months from publication  
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000316676500017
DO  - DOI:10.1016/j.tsf.2012.05.042
UR  - https://bib-pubdb1.desy.de/record/153863
ER  -