%0 Journal Article
%A Marciszko, Marianna
%A Baczmanski, Andrzej
%A Wrobel, Miroslaw
%A wilfrid, seiler
%A braham, chedly
%A Donges, Joern
%A Sniechowski, Maciej
%A Krzysztof, Wierzbanowski
%T Multireflection grazing incidence diffraction used for stress measurements in surface layers
%J Thin solid films
%V 530
%@ 0040-6090
%C Amsterdam [u.a.]
%I Elsevier
%M DESY-2013-00743
%P 81-84
%D 2013
%Z © Elsevier B.V. ; Post referee fulltext in progress; Embargo 12 months from publication  
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000316676500017
%R 10.1016/j.tsf.2012.05.042
%U https://bib-pubdb1.desy.de/record/153863