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Single-shot femtosecond x-ray diffraction from randomly oriented ellipsoidal nanoparticles
Bogan, M. J. ; Boutet, S.Extern* ; Barty, A.CFEL*DESY* ; Benner, W. H. ; Frank, M.Extern* ; Lomb, L.Extern* ; Shoeman, R.Extern* ; Starodub, D.Extern* ; Seibert, M. M. ; Hau-Riege, S. P. ; Woods, B.Extern* ; Decorwin-Martin, P. ; Bajt, S.CFEL*DESY* ; Schulz, J.XFEL.EU* ; Rohner, U.Extern* ; Iwan, B.Extern* ; Timneanu, N.Extern* ; Marchesini, S.Extern* ; Schlichting, I.Extern* ; Hajdu, J.Extern* ; Chapman, H. N.CFEL*DESY* ; DESY
2010
Soc.
[S.l.] @
This record in other databases:
Please use a persistent id in citations: doi:10.1103/PhysRevSTAB.13.094701 doi:10.3204/PHPPUBDB-14440
Contributing Institute(s):
- Experiments with synchrotron radiation (HASYLAB(-2012))
- European XFEL (Eur.XFEL)
Research Program(s):
- FLASH Beamline BL2 (POF2-54G16) (POF2-54G16)
Experiment(s):
- FLASH Beamline BL2 (FLASH)
Appears in the scientific report
2010
Database coverage:
;

; JCR ; No Author Disambiguation ; Thomson Reuters Master Journal List ; Web of Science Core Collection