Home > Publications database > Advantages of combined $\mu$-XRF and $\mu$-XRD for phase characterization of Ti-B-C ceramics compared with conventional X-ray diffraction |
Journal Article | PHPPUBDB-6815 |
; ; ; ; ;
2008
Springer
Berlin
This record in other databases:
Please use a persistent id in citations: doi:10.1007/s00216-008-2097-6
![]() |
The record appears in these collections: |