Home > Publications database > Low-temperature Zr mobility: An in-situ synchrotron-radiation XRF study of the effect of radiation damage in zircon on the element release in $H_{2}O+HCl\pm SiO_{2}$ fluids |
Journal Article | PHPPUBDB-82 |
; ; ; ; ;
2006
Soc.
Washington, DC
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Please use a persistent id in citations: doi:10.2138/am.2006.2244
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