| Home > Publications database > Degradation Mechanisms Associated with Electron‐Blocking Layers in Inverted Perovskite Solar Cells |
| Journal Article | PUBDB-2026-02891 |
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2026
Wiley-VCH
Weinheim
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Please use a persistent id in citations: doi:10.1002/advs.75170 doi:10.3204/PUBDB-2026-02891
Abstract: The operational stability, especially under thermal cycling conditions, of perovskite solar cells (PSCs) based on different electron-blocking layers (EBLs) is still missing. Here, we investigate the device performance of PSCs based on representative EBLs of NiO$_x$, PTAA, and 2PACz as well as the degradation mechanism using operando grazing incidence wide-angle X-ray (GIWAXS) measurements. 2PACz-based devices achieve an impressive PCE of 25.74% (certified 25.34%), which is significantly higher than 23.35% for NiO$_x$-based and 24.57% for PTAA-based PSCs, attributed to the reduced trap density, prolonged charge carrier lifetime, and suppressed non-radiative recombination. In addition, the 2PACz-based devices exhibit excellent stability under light soaking (>1500 h of T90 lifetime) and rapid solar-thermal cycling conditions (no PCE degradation). Operando GIWAXS demonstrates that this stability originates from a relatively lower lattice distortion at both the buried side and the surface side of the perovskite layer of the 2PACz-based device under the temperature variation during solar-thermal cycling conditions. This work provides experimental evidence for the rational selection of EBL materials and highlights the interface regulation for constructing highly stable perovskite devices.
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