Contribution to a conference proceedings/Journal Article

PUBDB-2026-01160

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Speckle analysis as a characterization tool for the focusing properties of diamond X-ray lenses

Youssef, M. H. (Corresponding author)Extern*XFEL.EU*DESY* ; Zozulya, A. V.XFEL.EU* ; Lyubomirskiy, M. ; Ansaldi, G.XFEL.EU* ; Hallmann, J.XFEL.EU* ; Jo, W. ; Moeller, J.XFEL.EU* ; Pudell, J.-E.XFEL.EU* ; Makita, M. ; Seiboth, F.XFEL.EU*DESY* ; Wang, W. ; Schroer, C. G.XFEL.EU*DESY* ; Madsen, A.

2025
IOP Publ. Bristol

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Please use a persistent id in citations: doi:10.1088/1742-6596/3010/1/012104  doi:10.3204/PUBDB-2026-01160

Abstract: The availability of intense X-ray beams at megahertz repetition rate allows for new scattering and imaging experiments using the unique pulse train structure of the European X-ray Free-Electron Laser (EuXFEL). However, the resulting heat load can pose challenges for X-ray optics and potentially limit the efficiency. In this context, X-ray optics made of diamond emerge as a promising solution better suited for the extreme beam conditions at EuXFEL. In this article, we demonstrate a simple speckle analysis to determine the size of the focused beam in a caustic scan. The lenses are 1D planar diamond lenses and experiments were performed at the Materials Imaging and Dynamics (MID) station of EuXFEL. We find a minimum beam size of 630 nm and compare the speckle method with the more conventional method of wire scanning.

Note: cc-by

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Contributing Institute(s):

1. FS-PETRA (FS-PETRA)
2. MID (XFEL_E1_MID)
3. OPTICS (HH_FS_P_OPT)

Research Program(s):

1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)

Experiment(s):

1. No specific instrument

Appears in the scientific report 2025

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Database coverage:
; ; ; Nationallizenz

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Linked articles:

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Book/Proceedings Laasch, W. (Editor)DESY* ; Feidenhans'l, R. (Editor)XFEL.EU*
Synchrotron radiation instrumentation: proceedings, 15th international conference, SR>I 2024, Hamburg, Germany August 26-30, 2024
202515th International Conference on Synchrotron Radiation Instrumentation, SRI 2024, HamburgHamburg, Germany, 26 Aug 2024 - 30 Aug 20242024-08-262024-08-30 Bristol, UK : IOP Publishing Ltd, Journal of Physics: Conference Series 3010 (2025), nonconsec. pag. (2025)2025     Files  Fulltext BibTeX | EndNote: XML, Text | RIS

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