guest ::
| Home > In process > Development of a New Generation Multi-Element Monolithic HPGe sensor for XAFS applications |
| Home > In process > Development of a New Generation Multi-Element Monolithic HPGe sensor for XAFS applications |
| Journal Article | PUBDB-2026-01157 |
; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ;
2025
IOP Publ.
Bristol
This record in other databases:
Please use a persistent id in citations: doi:10.1088/1742-6596/3010/1/012144
Abstract: Recent upgrades in synchrotron radiation facilities, which now produce highly brilliant and coherent beams, result in a broader array of experiments challenging the available detectors. In X-ray Absorption Fine Structure (XAFS) experiments, detector performance is often a limiting factor, especially with the high photon fluxes from upgraded facilities. Within this context, a consortium of European facilities has joined under the LEAPS-INNOV project to push the current technologies and develop a germanium detector that can operate under high photon fluxes. The latest status of the XAFS detector development is presented here. The project has moved from the design and simulations phase to the assembled stage, with the sensor, electronic chain and mechanics being manufactured and tested. Next steps are focused on integrating all parts together and characterize the detector performance with X-ray beam.
; Nationallizenz
|
The record appears in these collections: |
PDF
PDF (PDFA)